- Device
- Johannes Gutenberg University Mainz
TESCAN Clara scanning microscope
- Biology
- Materials Science
- Electron Microscopy
- Device Type
- Electron Microscope
- Device Name
- TESCAN Clara scanning microscope
- Device Variants
- Scanning Electron Microscope
Device Description
High-resolution scanning electron microscope with field emission gun (FEG) with backscattered electron diffraction (Oxford EBSD), 2 x EDXS (windowless with large solid angle), Leica cryo system.
Device Application
Electron microscope imaging suitable for beam- and vacuum-sensitive samples, phase analysis using backscatter detector.
