- Device
- Johannes Gutenberg University Mainz
FEI Nova NanoSEM
- Biology
- Materials Science
- Electron Microscopy
- Device Type
- Electron Microscope
- Device Name
- FEI Nova NanoSEM
- Device Variants
- Scanning Electron Microscope
Device Description
High-resolution scanning electron microscope (up to 1.8 nm resolution) with field emission gun (Schottky FEG) and elemental analysis (EDAX-Pegasus X4M). Detectors: Everhart-Thornley (ETD), through lens (TLD), low-voltage high-contrast detector (vCD), backscattered electrons (BSED).
Device Application
Electron microscope images of bulk samples. Detection of chemical composition.
