- Device
- Johannes Gutenberg University Mainz
Hitachi SU-8000
- Biology
- Materials Science
- Electron Microscopy
- Device Type
- Electron Microscope
- Device Name
- Hitachi SU-8000
- Device Variants
- Scanning Electron Microscope
Device Description
High-resolution scanning electron microscope (up to 1.8 nm resolution) with field emission gun (Cold-FEG), elemental analysis (EDXS Bruker Quantax), and energy filter (ExB). Detectors: Everhart-Thornley (ETD), through lens (TLD), on-lens (top, bottom), low-voltage high-contrast detector (vCD).
Device Application
Electron microscope images of bulk samples. Detection of chemical composition. A cryo-preparation unit with transfer system is available for wet samples or samples that undergo changes during drying.
