- Device
- Technical University of Darmstadt
Sentech SE 850
- Materials Science
- Structuring and Processing of Materials
- Device Type
- Ellipsometer
- Device Name
- Sentech SE 850
Device Description
Ellipsometer for VIS and NIR.
Device Application
Measurement of the refractive index and thickness of transparent layers.
Core Facility
ETIT Clean Room Facilities
Project Status
default
